BL12 : experimental equipment

XPS/NEXAFS Endstation

 
Photoelectron spectroscopy and soft X-ray absorption spectroscopy (NEXAFS)

<Main chamber>
• ultrahigh vacuum (base pressure: 3×10-8 Pa)

 

 

<Analyzer>
• hemispherical electron energy analyzer
• multichannel detector 
• aperture: 0.8 mmφ 

 

 

<Ar ion gun and electron neutralizer>
<Sample stage>
• four axes (XYZ, θ/pitch)
• sample heating/cooling

 

800ºC > T > -110ºC (LN2)
• Sample drain current measurement

 

 

<Quick insertion system>
• sample bank for six holders

XPS: X-ray photoelectron spectroscopy NEXAFS: Near-edge X-ray absorption fine structure

XPS: X-ray photoelectron spectroscopy
NEXAFS: Near-edge X-ray absorption fine structure

X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy measurements can be performed using this endstation. Solid samples (substrate/powder/wire shaped) can be measured by both methods at the same location on the sample. The spot size of the photon beam is ~1.5 mm (H) × ~0.6 mm (V). The samples are attached with a screw, a mask or double-sided vacuum carbon tape to a 1-inch-diameter sample holder (Figs. 1 and 2). The sample size should be 4 × 4 ~ 15 × 15 mm2, 0.2 ~ 1 mm thick. Thicker samples can be set using a special holder with a dent (Fig. 3). Please contact us for more details.

Flat holder Example of sample setting using masks with two holes (left) and three holes (right). Special holder with a dent
Fig. 1: Flat holder Fig. 2: Example of sample setting using masks with two holes (left) and three holes (right). Fig. 3: Special holder with a dent.

NEXAFS Endstation

 

Kyushu Synchrotron Light Research Center
8-7 Yayoigaoka Tosu-Shi Saga, 841-0005,JAPAN
TEL81942-83-5017FAX81942-83-5196

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