Materials science beamline

This beamline is designed for material characterization and structural analysis using monochromatic hard X-rays.


XAFS SAXS Diffraction
XAFS SAXS Diffraction

Energy range

2.1 ~ 23 keV

Energy resolution (DE/E)

10-4 ~ 10-3

Photon flux

108 ~ 1011 photons/sec

Beam size at the focal point

0.5 mm (H) × 0.4 mm (V)

Area of research (keywords)

X-ray fluorescent analysis, X-ray diffraction, X-ray absorption fine structure (XAFS), small-angle X-ray scattering (SAXS), imaging, X-ray reflectivity (analysis of composition, structure, morphology, film thickness, etc. for bulk crystals, thin films, powder, and nanoscale materials).

Experimental stations




Kyushu Synchrotron Light Research Center
8-7 Yayoigaoka Tosu-Shi Saga, 841-0005,JAPAN
TEL:81942-83-5017 FAX:81942-83-5196

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